Rumiantsev, Andrej (Autor)
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond
Beschreibung
Produktdetails
| ISBN/GTIN | 978-1-000-79285-0 |
|---|---|
| Seitenzahl | 156 S. |
| Kopierschutz | Digital Rights Management |