Pantelides, Sokrates T. (Hrsg.)
The Physics of SiO2 and Its Interfaces
Proceedings of the International Topical Conference on the Physics of SiO2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22-24, 1978
Beschreibung
Produktdetails
| ISBN/GTIN | 978-1-4831-3900-5 |
|---|---|
| Seitenzahl | 500 S. |
| Kopierschutz | Digital Rights Management |
| Dateigröße | 60812 Kbytes |