Garg, Rajesh (Autor) Khatri, Sunil P. (Autor)

Analysis and Design of Resilient VLSI Circuits

Mitigating Soft Errors and Process Variations

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Beschreibung

This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems.

Produktdetails

ISBN/GTIN 978-1-4419-0931-2
Seitenzahl 212 S.
Kopierschutz mit Wasserzeichen
Dateigröße 5928 Kbytes

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