Stanisavljevic, Milos (Autor)
Schmid, Alexandre (Autor)
Leblebici, Yusuf (Autor)
Reliability of Nanoscale Circuits and Systems
Methodologies and Circuit Architectures

Beschreibung
In a first part, this book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. In the second part, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
Produktdetails
ISBN/GTIN | 978-1-4419-6217-1 |
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Seitenzahl | 195 S. |
Kopierschutz | mit Wasserzeichen |
Dateigröße | 6252 Kbytes |