Stanisavljevic, Milos (Autor) Schmid, Alexandre (Autor) Leblebici, Yusuf (Autor)

Reliability of Nanoscale Circuits and Systems

Methodologies and Circuit Architectures

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Beschreibung

In a first part, this book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. In the second part, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

Produktdetails

ISBN/GTIN 978-1-4419-6217-1
Seitenzahl 195 S.
Kopierschutz mit Wasserzeichen
Dateigröße 6252 Kbytes

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