Fan, Yongquan (Autor) Zilic, Zeljko (Autor)

Accelerating Test, Validation and Debug of High Speed Serial Interfaces

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Beschreibung

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. Accelerating Test, Validation and Debug of High Speed Serial Interfaces provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces.

Produktdetails

ISBN/GTIN 978-90-481-9398-1
Seitenzahl 100 S.
Kopierschutz mit Wasserzeichen
Dateigröße 8551 Kbytes

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