Huang, Chao (Hrsg.)

Robust Computing with Nano-scale Devices

Progresses and Challenges

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Beschreibung

Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic barriers to lithography. The quantum effects and increasing leakage power begin setting physical limits on continuous CMOS feature size shrinking.

Produktdetails

ISBN/GTIN 978-90-481-8540-5
Seitenzahl 180 S.
Kopierschutz mit Wasserzeichen
Dateigröße 5405 Kbytes

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