Sun, Q. P. (Hrsg.)
Tong, P. (Hrsg.)
IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales
Proceedings of the IUTAM Symposium held in Hong Kong, China, 31 May - 4 June, 2004

Beschreibung
This volume is a collection of twenty five written contributions by distinguished invited speakers from seven countries to the IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-scales. Size effects on material and structural behaviors are of great interest to physicists, material scientists, and engineers who need to understand and model the mechanical behavior of solids especially at micron- and nano-scales.
Produktdetails
ISBN/GTIN | 978-1-4020-4946-0 |
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Seitenzahl | 272 S. |
Kopierschutz | mit Wasserzeichen |
Dateigröße | 12495 Kbytes |